SEM IRRADIATION FOR HARDNESS ASSURANCE SCREENING AND PROCESS DEFINITION

被引：9

|

作者：

COHEN, S

HUGHES, H

机构：

[1] RCA,SOLID STATE TECHNOL CTR,SOMERVILLE,NJ 08876

[2] USN,RES LAB,WASHINGTON,DC

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1974年 / NS21卷 / 06期

关键词：

D O I：

10.1109/TNS.1974.6498958

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：387 / 389

页数：3

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