REDUNDANCY RELATIONS AND ROBUST FAILURE-DETECTION

被引：0

作者：

CHOW, EY

LOU, XC

VERGHESE, GC

WILLSKY, AS

机构：

[1] MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139

[2] MIT,INFORMAT & DECIS SYST LAB,CAMBRIDGE,MA 02139

[3] MIT,ELECT POWER SYST ENGN LAB,CAMBRIDGE,MA 02139

来源：

LECTURE NOTES IN CONTROL AND INFORMATION SCIENCES | 1986年 / 77卷

关键词：

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：275 / 293

页数：19

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