PHOTOLUMINESCENCE MEASUREMENTS AT THE SI/SIO2 INTERFACE

被引:1
|
作者
MARTELLI, F
机构
关键词
D O I
10.1016/0039-6028(86)91039-3
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:676 / 681
页数:6
相关论文
共 50 条
  • [11] Optics of Si/SiO2 superlattices:: Application to Raman scattering and photoluminescence measurements
    Khriachtchev, L
    Novikov, S
    Kilpelä, O
    JOURNAL OF APPLIED PHYSICS, 2000, 87 (11) : 7805 - 7813
  • [12] DETERMINATION OF THE SIO2/SI INTERFACE ROUGHNESS BY DIFFUSE REFLECTANCE MEASUREMENTS
    ROOS, A
    BERGKVIST, M
    RIBBING, CG
    APPLIED OPTICS, 1988, 27 (20): : 4314 - 4317
  • [13] Photoluminescence of SiO2 and α-Si with silicon nanoinclusions
    Gaponova, DM
    Gorshkov, ON
    Revin, DG
    Tetelbaum, DI
    Trushin, SA
    SMART OPTICAL INORGANIC STRUCTURES AND DEVICES, 2001, 4318 : 31 - 35
  • [14] MICROVOIDS AT THE SIO2/SI INTERFACE
    NIELSEN, B
    LYNN, KG
    WELCH, DO
    LEUNG, TC
    RUBLOFF, GW
    PHYSICAL REVIEW B, 1989, 40 (02): : 1434 - 1437
  • [15] SI/SIO2 INTERFACE STRUCTURES IN LASER-RECRYSTALLIZED SI ON SIO2
    OGURA, A
    AIZAKI, N
    APPLIED PHYSICS LETTERS, 1989, 55 (06) : 547 - 549
  • [16] THE SI(001)/SIO2 INTERFACE
    OURMAZD, A
    FUOSS, PH
    BEVK, J
    MORAR, JF
    APPLIED SURFACE SCIENCE, 1989, 41-2 : 365 - 371
  • [17] DEFECTS AT THE SI/SIO2 INTERFACE OF SIO2 PRECIPITATES IN SILICON
    HOBBS, A
    BARKLIE, RC
    REESON, K
    HEMMENT, PLF
    ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE NEUE FOLGE, 1987, 151 : 251 - 257
  • [18] INTERFACE RECOMBINATION VELOCITY AT THE SI/SIO2 INTERFACE DETERMINED FROM BIAS-DEPENDENT PHOTOLUMINESCENCE
    STEIN, N
    ROPPISCHER, H
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1991, 123 (01): : 139 - 150
  • [19] Si emission from the SiO2/Si interface during the growth of SiO2 in the HfO2/SiO2/Si structure
    Ming, Z
    Nakajima, K
    Suzuki, M
    Kimura, K
    Uematsu, M
    Torii, K
    Kamiyama, S
    Nara, Y
    Yamada, K
    APPLIED PHYSICS LETTERS, 2006, 88 (15)
  • [20] Photoluminescence spectrum of a-Si/SiO2 and c-Si/SiO2 quantum wells
    Kanemitsu, Y
    Iiboshi, M
    Kushida, T
    JOURNAL OF LUMINESCENCE, 2000, 87-9 : 463 - 465