BOUNDARY-SCAN TESTING

被引：0
|
作者：
MAUNDER, C
机构：
来源：
MICROPROCESSORS AND MICROSYSTEMS | 1993年 / 17卷 / 05期
关键词：
D O I：
10.1016/0141-9331(93)90001-N
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：258 / 258
页数：1
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