X-RAY TOPOGRAPHIC STUDIES OF AS-GROWN DEFECTS IN NATURAL MUSCOVITE

被引:10
|
作者
CORNY, F
BARONNET, A
JOURDAN, C
机构
[1] UNIV AIX MARSEILLE 3,CTR ST JEROME,CTR MECANISMES CROISSANCE CRISTALLINE,F-13397 MARSEILLE,FRANCE
[2] UNIV AIX MARSEILLE 3,MINERAL & CRISTALLOGRAPHIE LAB,F-13397 MARSEILLE,FRANCE
关键词
D O I
10.1016/0022-0248(76)90145-7
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
收藏
页码:304 / 315
页数:12
相关论文
共 50 条
  • [21] X-ray topographic study of Bridgman-grown CdZnTeSe
    Roy, Utpal N.
    Camarda, Giuseppe S.
    Cui, Yonggang
    James, Ralph B.
    JOURNAL OF CRYSTAL GROWTH, 2020, 546
  • [22] X-RAY TOPOGRAPHIC STUDY OF FLUX GROWN KTP CRYSTALS
    HALFPENNY, PJ
    ONEILL, L
    SHERWOOD, JN
    SIMPSON, GS
    YOKOTANI, A
    MIYAMOTO, A
    SASAKI, T
    NAKAI, S
    JOURNAL OF CRYSTAL GROWTH, 1991, 113 (3-4) : 722 - 725
  • [23] X-RAY TOPOGRAPHIC ASSESSMENT OF FLUX GROWN BAFCI CRYSTALS
    SOMAIAH, K
    MOINUDDIN, SR
    RAO, UVS
    BABU, VH
    JOURNAL OF MATERIALS SCIENCE LETTERS, 1983, 2 (07) : 314 - 316
  • [24] X-ray topographic characterization of epitaxially grown diamond film
    Suzuki, CK
    Shinohara, AH
    Godoy, PH
    Watanabe, N
    Kamo, M
    DIAMOND AND RELATED MATERIALS, 1998, 7 (2-5) : 289 - 292
  • [25] Dynamical X-ray diffraction theory: Characterization of defects and strains in as-grown and ion-implanted garnet structures
    Olikhovskii, S. I.
    Molodkin, V. B.
    Skakunova, O. S.
    Len, E. G.
    Kyslovskyy, Ye. M.
    Vladimirova, T. P.
    Reshetnyk, O. V.
    Kochelab, E. V.
    Lizunova, S. V.
    Pylypiv, V. M.
    Ostafiychuk, B. K.
    Garpul, O. Z.
    PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2017, 254 (07):
  • [26] X-RAY TOPOGRAPHIC OBSERVATION OF LATTICE DEFECTS IN TGS CRYSTALS
    POLCAROVA, M
    JANTA, J
    CZECHOSLOVAK JOURNAL OF PHYSICS, 1973, B 23 (03) : 331 - +
  • [27] X-RAY TOPOGRAPHIC STUDY OF CRYSTAL DEFECTS IN DOLOMITE AND MAGNESITE
    ZARKA, A
    BULLETIN DE LA SOCIETE FRANCAISE MINERALOGIE ET DE CRISTALLOGRAPHIE, 1969, 92 (02): : 160 - &
  • [28] AN X-RAY TOPOGRAPHIC STUDY OF D-DEFECTS IN SILICON
    VYSOTSKAYA, VV
    GORIN, SN
    SOROKIN, LM
    SHEIKHET, EG
    FIZIKA TVERDOGO TELA, 1987, 29 (06): : 1858 - 1861
  • [29] X-RAY STUDIES OF DEFECTS IN CLAYS
    TCHOUBAR, C
    PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1984, 311 (1517): : 259 - 269
  • [30] X-RAY DIFFRACTION TOPOGRAPHIC STUDIES OF DISLOCATIONS IN NATURAL LARGE ICE SINGLE CRYSTALS
    FUKUDA, A
    HIGASHI, A
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1969, 8 (08) : 993 - &