HIGH-RESOLUTION SCANNING ION MICROSCOPY AND SECONDARY-ION MASS-SPECTROMETRY - PROBLEMS AND SOLUTIONS

被引：0
|
作者：
LIEBL, H
机构：
来源：
SCANNING ELECTRON MICROSCOPY | 1984年
关键词：
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：519 / 528
页数：10
相关论文
共 50 条
  • [41] DIFFUSION OF TIN IN GERMANIUM STUDIED BY SECONDARY-ION MASS-SPECTROMETRY
    FRIESEL, M
    SODERVALL, U
    GUST, W
    JOURNAL OF APPLIED PHYSICS, 1995, 78 (09) : 5351 - 5355
  • [42] ENHANCED IONIZATION OF ORGANIC SALTS IN SECONDARY-ION MASS-SPECTROMETRY
    HSU, BH
    XIE, YX
    BUSCH, KL
    COOKS, RG
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 51 (2-3): : 225 - 233
  • [43] OPTIMIZATION OF SECONDARY-ION MASS-SPECTROMETRY FOR QUANTITATIVE TRACE ANALYSIS
    STINGEDER, G
    ANALYTICA CHIMICA ACTA, 1994, 297 (1-2) : 231 - 251
  • [44] SURFACE-ANALYSIS BY SECONDARY-ION MASS-SPECTROMETRY (SIMS)
    BENNINGHOVEN, A
    SURFACE SCIENCE, 1994, 299 (1-3) : 246 - 260
  • [45] Detection Limit of Phosphorus in Diamond by High Mass Resolution Secondary-Ion Mass Spectrometry
    Pinault-Thaury, Marie-Amandine
    Jomard, Francois
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2023, 220 (04):
  • [46] ACCELERATOR BASED SECONDARY-ION MASS-SPECTROMETRY FOR IMPURITY ANALYSIS
    ANTHONY, JM
    KIRCHHOFF, JF
    MARBLE, DK
    RENFROW, SN
    KIM, YD
    MATTESON, S
    MCDANIEL, FD
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1994, 12 (04): : 1547 - 1550
  • [47] SECONDARY-ION MASS-SPECTROMETRY ON INSULATORS WITH NEUTRAL PRIMARY PARTICLES
    BORCHARDT, G
    SCHERRER, S
    WEBER, S
    MIKROCHIMICA ACTA, 1981, 2 (5-6) : 421 - 432
  • [48] HIGH-RESOLUTION SCANNING ION MICROSCOPY
    SCHWARZSCHILD, BM
    PHYSICS TODAY, 1982, 35 (07) : 20 - 22
  • [49] THE APPLICATION OF HIGH-RESOLUTION MASS-SPECTROMETRY TO SELECTED ION MONITORING
    HAZELBY, D
    TAYLOR, KT
    ANNALI DI CHIMICA, 1980, 70 (5-6) : 201 - 216
  • [50] CALCULATION OF ION COMPOSITION IN ORGANIC HIGH-RESOLUTION MASS-SPECTROMETRY
    IOFFE, BV
    VITENBERG, DA
    ZENKEVICH, IG
    ORGANIC MASS SPECTROMETRY, 1993, 28 (08): : 907 - 913
12345