共 50 条
- [47] EFFECTIVE DIFFUSION LENGTH OF MINORITY-CARRIERS IN POLYCRYSTALLINE SILICON PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1984, 84 (01): : 311 - 317
- [49] MINORITY-CARRIER DIFFUSION LENGTH MAPPING OF EXTENDED CRYSTALLOGRAPHIC DEFECTS IN SEMICONDUCTOR SILICON DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS AND DEVICES, 1994, (135): : 239 - 242
- [50] INFLUENCE OF PROCESSING TEMPERATURE ON MINORITY-CARRIER DIFFUSION LENGTH OF LOWER PURITY SILICON ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1987, 67 (04): : 453 - 458