PHOTOCONDUCTIVITY MEASUREMENTS AS A TOOL FOR THE EVALUATION OF THE DENSITY OF STATES IN AMORPHOUS-SILICON

被引：1

作者：

AUGELLI, V ^{[1
]}

BERARDI, V ^{[1
]}

MURRI, R ^{[1
]}

SCHIAVULLI, L ^{[1
]}

机构：

[1] GRP NAZL STRUTTURA MAT,UNITA CISM,I-70126 BARI,ITALY

来源：

PHYSICA SCRIPTA | 1988年 / 38卷 / 02期

关键词：

D O I：

10.1088/0031-8949/38/2/014

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：188 / 190

页数：3

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