HIGH SPATIAL-RESOLUTION MAPPING OF THE CEPHEUS A REGION AT 20-MICRON, 50-MICRON, AND 100-MICRON

被引:10
|
作者
ELLIS, HB
LESTER, DF
HARVEY, PM
JOY, M
TELESCO, CM
DECHER, R
WERNER, MW
机构
[1] UNIV TEXAS,DEPT ASTRON,AUSTIN,TX 78712
[2] UNIV TEXAS,MCDONALD OBSERV,AUSTIN,TX 78712
[3] NASA,GEORGE C MARSHALL SPACE FLIGHT CTR,SPACE SCI LAB,HUNTSVILLE,AL 35812
[4] NASA,AMES RES CTR,DIV EXPTL SURG,MOFFETT FIELD,CA 94035
来源
ASTROPHYSICAL JOURNAL | 1990年 / 365卷 / 01期
关键词
Infrared: sources; Nebulae: individual (Cepheus A); Stars: formation;
D O I
10.1086/169481
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
We have mapped a 50″ x 30″ region in Cepheus A with a 4″ beam at 20 μm. We observed a bright, unresolved, central source with peak flux of 41 Jy into our beam, but otherwise detected no 20 μm emission in the region down to a 3 σ upper limit of 3 Jy per pixel. We also obtained one-dimensional scans across Cepheus A at 50 and 100 μm using diffraction limited slit apertures. In all the scans the source is noticeably resolved in comparison to the point source profiles. From these data we calculate spatial profiles of the 50/100 μm color temperature and 100 μm optical depth. The temperature profile is relatively flat, with a maximum value of 46 K, while the optical depth shows a well-defined peak in the dust column density with a maximum 100 μm optical depth of 0.4. Within errors, the position of the peak of the far-infrared emission is found to be the same as the 20 μm source. Application of a maximum entropy deconvolution technique to the 50 μm and 100 μm profiles yields spatial resolution better than the diffraction limit. It is apparent from these deconvolutions that the far-infrared source consists of a bright, compact core with clumpy extended emission. We have constructed models of the far-infrared source and generated theoretical slit scans to compare with our observations. These calculations demonstrate that the 100 μm optical depth through the center of the Cepheus A cloud could be a factor of 2 or more higher than the value (0.4) we have derived from a simple slab model. We interpret these data to indicate that a deeply embedded object with L ≈ 2.5 x 104 L⊙ is the main luminosity source in the Cepheus A region.
引用
收藏
页码:287 / 295
页数:9
相关论文
共 38 条
  • [21] High-resolution peptide mapping using sub-two micron columns
    Nguyen, Reno
    Wang, Joyce
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2009, 237 : 253 - 253
  • [22] HIGH-RESOLUTION 12.4 MICRON IMAGES OF THE STARBURST REGION IN M82
    TELESCO, CM
    GEZARI, DY
    ASTROPHYSICAL JOURNAL, 1992, 395 (02): : 461 - &
  • [23] HIGH SPATIAL-RESOLUTION OBSERVATIONS OF S-106 FROM LAMBDA=0.6 MICRON TO LAMBDA=1.3 CM - A WIND MODEL FOR THE BIPOLAR NEBULA
    FELLI, M
    STAUDE, HJ
    REDDMANN, T
    MASSI, M
    EIROA, C
    HEFELE, H
    NECKEL, T
    PANAGIA, N
    ASTRONOMY & ASTROPHYSICS, 1984, 135 (02): : 261 - 280
  • [24] Sub-micron spatial resolution Raman spectroscopy and its application to stress mapping in silicon.
    Webster, S
    Smith, DA
    Batchelder, DN
    Karlin, S
    SYNTHETIC METALS, 1999, 102 (1-3) : 1425 - 1427
  • [25] HIGH-RESOLUTION SPECTROSCOPY IN THE 3-5 MICRON REGION WITH A SMALL GRATING SPECTROMETER
    LORD, RC
    MCCUBBIN, TK
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1955, 45 (06) : 441 - 446
  • [26] High spatial resolution strain measurement of deep sub-micron semiconductor devices using CBED
    Toh, SL
    Li, K
    Ang, CH
    Er, E
    Redkar, S
    Loh, KP
    Boothroyd, CB
    Chan, L
    IPFA 2004: PROCEEDINGS OF THE 11TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS, 2004, : 143 - 146
  • [27] Titan's 3-micron spectral region from ISO high-resolution spectroscopy
    Coustenis, A
    Negrao, A
    Salama, A
    Schulz, B
    Lellouch, E
    Rannou, P
    Drossart, P
    Encrenaz, T
    Schmitt, B
    Boudon, V
    Nikitin, A
    ICARUS, 2006, 180 (01) : 176 - 185
  • [28] HIGH-RESOLUTION INFRARED SPECTROSCOPY WITH A SMALL GRATING SPECTROMETER - THE 5-15 MICRON REGION
    LORD, RC
    MCCUBBIN, TK
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1956, 46 (05) : 377 - 377
  • [29] Evaluation of Strategies to Increase the Spatial Resolution of X-Ray-Mapping in the FESEM of Low Concentration in Sub-Micron microstructures
    Hovington, Pierre
    Pinard, Philippe T.
    Lagace, M.
    Thibault, D.
    Rodrigue, L.
    Gauvin, R.
    Drouin, D.
    MICROSCOPY AND MICROANALYSIS, 2009, 15 : 480 - 481
  • [30] Mapping graphene layer number at few-micron-scale spatial resolution over large areas using laser scanning
    Carr, Amanda J.
    DeGennaro, Daniel
    Andrade, Joseph
    Barrett, Alexander
    Bhatia, Surita R.
    Eisaman, Matthew D.
    2D MATERIALS, 2021, 8 (02)