DEVELOPMENT OF THEORY OF CONTRAST FORMATION IN SCANNING ELECTRON MICROSCOPE IMAGE OF A P-N JUNCTION

被引：0
|
作者：
SPIVAK, GV
SAPARIN, GV
SEDOV, NN
KOMOLOVA, LF
机构：
来源：
IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA | 1968年 / 32卷 / 07期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：1124 / &
相关论文
共 50 条
  • [21] Electron beam induced current microscopy of silicon p-n junctions in a scanning transmission electron microscope
    Conlan, Aidan P.
    Moldovan, Grigore
    Bruas, Lucas
    Monroy, Eva
    Cooper, David
    JOURNAL OF APPLIED PHYSICS, 2021, 129 (13)
  • [22] Formation of p-n junction by diffusion bonding
    Ohashi, Osamu
    Yoshioka, Takayuk
    Hashimoto, Masayasu
    Nagai, Terutomo
    Welding Research Abroad, 2000, 46 (12):
  • [23] Formation of p-n junction by diffusion bonding
    Ohashi, Osamu
    Yoshioka, Takayuki
    Hashimoto, Masayasu
    Nagai, Terutomo
    2000, Japan Welding Soc, Tokyo, Japan (18):
  • [24] CONTRAST OF SECONDARY-ELECTRON IMAGE OF SCANNING ELECTRON-MICROSCOPE
    SAKATA, S
    JOURNAL OF ELECTRON MICROSCOPY, 1972, 21 (01): : 95 - &
  • [25] P/N JUNCTION LOCALIZATION IN INTEGRATED-CIRCUITS WITH SCANNING ELECTRON-MICROSCOPE
    MADL, K
    TOTH, AL
    BARNA, A
    EUREM 88, VOLS 1-3: TUTORIALS, INSTRUMENTATION AND TECHNIQUES / PHYSICS AND MATERIALS / BIOLOGY, 1988, 93 : 65 - 66
  • [26] Imaging the formation of a p-n junction in a suspended carbon nanotube with scanning photocurrent microscopy
    Buchs, Gilles
    Barkelid, Maria
    Bagiante, Salvatore
    Steele, Gary A.
    Zwiller, Val
    JOURNAL OF APPLIED PHYSICS, 2011, 110 (07)
  • [27] P/N JUNCTION LOCALIZATION IN INTEGRATED-CIRCUITS WITH SCANNING ELECTRON-MICROSCOPE
    MADL, K
    TOTH, AL
    BARNA, A
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1988, (93): : 65 - 66
  • [28] Comparative study of image contrast in scanning electron microscope and helium ion microscope
    O'Connell, R.
    Chen, Y.
    Zhang, H.
    Zhou, Y.
    Fox, D.
    Maguire, P.
    Wang, J. J.
    Rodenburg, C.
    JOURNAL OF MICROSCOPY, 2017, 268 (03) : 313 - 320
  • [29] ON CONTRAST OF SCANNING-ELECTRON-MICROSCOPE IMAGE OF MAGNETIC MICROFIELDS
    SPIVAK, GV
    SAPARIN, GV
    SEDOV, NN
    KOMOLOVA, LF
    IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1968, 32 (06): : 962 - &
  • [30] FORMATION OF RELIEF CONTRAST OF EXTENDED SURFACES IN ELECTRON EMISSION MICROSCOPE AND SCANNING MICROSCOPE
    SEILER, H
    LENZ, F
    OPTIK, 1968, 27 (07): : 438 - &
12345