MICROSCOPIC THEORY OF DRIVING FORCE IN ELECTROMIGRATION

被引：82

作者：

SHAM, LJ ^{[1
]}

机构：

[1] IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA

来源：

PHYSICAL REVIEW B | 1975年 / 12卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.12.3142

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：3142 / 3149

页数：8

共 50 条

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