A BEAM-SCANNING X-RAY FLAW DETECTOR

被引：0
|
作者：
GUSEV, EA
NOVITSKII, FN
机构：
来源：
SOVIET JOURNAL OF NONDESTRUCTIVE TESTING-USSR | 1987年 / 23卷 / 05期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：303 / 306
页数：4
相关论文
共 50 条
  • [21] Effective X-ray beam size measurements of an X-ray tube and polycapillary X-ray lens system using a scanning X-ray fluorescence method
    Gherase, Mihai R.
    Vargas, Andres Felipe
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 395 : 5 - 12
  • [22] Correlation of flaw structure and cracking behavior in SHCC with X-ray CT scanning technique
    Lu, Cong
    Pan, Jinlong
    Luo, Baohong
    Li, Zhenghao
    Leung, Christopher K. Y.
    CONSTRUCTION AND BUILDING MATERIALS, 2022, 331
  • [23] Inverse Geometry X-Ray Fluoroscopy Using Scanning-Beam Digital X-Ray Technology
    Speidel, M.
    MEDICAL PHYSICS, 2011, 38 (06) : 3774 - +
  • [24] Integrating Silicon detector with segmentation for scanning transmission X-ray microscopy
    Feser, Michael
    Hornberger, Benjamin
    Jacobsen, Chris
    De Geronimo, Gianluigi
    Rehak, Pavel
    Holl, Peter
    Strueder, Lothar
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2006, 565 (02): : 841 - 854
  • [25] Differential phase contrast with a segmented detector in a scanning X-ray microprobe
    Hornberger, B.
    de Jonge, M. D.
    Feser, M.
    Holl, P.
    Holzner, C.
    Jacobsen, C.
    Legnini, D.
    Paterson, D.
    Rehak, P.
    Strueder, L.
    Vogt, S.
    JOURNAL OF SYNCHROTRON RADIATION, 2008, 15 : 355 - 362
  • [26] APPLICATIONS OF A CCD DETECTOR IN SCANNING-TRANSMISSION X-RAY MICROSCOPE
    CHAPMAN, HN
    JACOBSEN, C
    WILLIAMS, S
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (02): : 1332 - 1334
  • [27] Scanning transmission X-ray microscopy with a fast, framing pixel detector
    Menzel, A.
    Kewish, C. M.
    Kraft, P.
    Henrich, B.
    Jefimovs, K.
    Vila-Comamala, J.
    David, C.
    Dierolf, M.
    Thibault, P.
    Pfeiffer, F.
    Bunk, O.
    ULTRAMICROSCOPY, 2010, 110 (09) : 1143 - 1147
  • [28] X-RAY MICRODIFFRACTION WITH A SCANNING X-RAY MICROANALYZER
    ICHINOKAWA, T
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1966, 5 (09) : 796 - +
  • [29] X-RAY FLAW-DETECTION APPARATUS
    ALEEV, PA
    GUSEV, EA
    LEONOV, BI
    SOVIET JOURNAL OF NONDESTRUCTIVE TESTING-USSR, 1982, 18 (10): : 770 - 773
  • [30] Wideband and Beam-Scanning Reflectarrays
    Yang, Fan
    2015 INTERNATIONAL WORKSHOP ON ANTENNA TECHNOLOGY (IWAT), 2015, : 41 - 42
12345