CONTINUOUS COATING THICKNESS MEASUREMENT OF STRIP MATERIAL USING X-RAY-FLUORESCENCE

被引：0

作者：

CHRISTENSEN, RW ^{[1
]}

机构：

[1] FISCHER TECHNOL,WINDSOR,CT

来源：

PLATING AND SURFACE FINISHING | 1987年 / 74卷 / 02期

关键词：

D O I：

暂无

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

页码：37 / 37

页数：1

共 50 条

[31] THICKNESS MEASUREMENT OF ALUMINUM, TITANIUM, TITANIUM SILICIDE, AND TUNGSTEN SILICIDE FILMS BY X-RAY-FLUORESCENCE
ERNST, S
LEE, CO
LEE, JJ
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (08) : 2111 - 2113
[32] ON THE INVIVO MEASUREMENT OF MERCURY USING NEUTRON-CAPTURE AND X-RAY-FLUORESCENCE
SMITH, JRH
ATHWAL, SS
CHETTLE, DR
SCOTT, MC
INTERNATIONAL JOURNAL OF APPLIED RADIATION AND ISOTOPES, 1982, 33 (07): : 557 - 561
[33] THICKNESS DETERMINATION OF ULTRATHIN METAL-FILMS USING THE X-RAY-FLUORESCENCE TECHNIQUE
KAUSHIK, DK
SINGH, SP
BHAN, C
CHATTOPADHYAYA, SK
NATH, N
THIN SOLID FILMS, 1980, 67 (02) : 353 - 356
[34] THE INSITU MEASUREMENT OF STRONTIUM CONTENT IN BONE USING X-RAY-FLUORESCENCE ANALYSIS
SNYDER, RE
SECORD, DC
PHYSICS IN MEDICINE AND BIOLOGY, 1982, 27 (04): : 515 - 529
[35] HIGH-PRECISION MEASUREMENT OF PHOSPHORUS IN GLASSES USING X-RAY-FLUORESCENCE
MADDEN, M
COX, JN
FRUECHTING, B
MATTEAU, J
SOLID STATE TECHNOLOGY, 1989, 32 (08) : 53 - 55
[36] Measurement of coating thickness on wires by micro-beam X-ray fluorescence
Rößiger, V.
Galvanotechnik, 2002, 93 (09): : 2262 - 2265
[37] BETA BACKSCATTER VERSUS X-RAY FLUORESCENCE FOR COATING THICKNESS MEASUREMENT.
Latter, Terence D.T.
Product Finishing (London), 1982, 35 (11): : 9 - 10
[38] DETERMINATION OF SULFUR IN PLANT MATERIAL BY X-RAY-FLUORESCENCE SPECTROSCOPY
REED, B
JOURNAL OF THE SCIENCE OF FOOD AND AGRICULTURE, 1973, 24 (02) : 139 - 146
[39] IDENTIFICATION OF RADIOPAQUE MATERIAL IN MAXILLARY SINUS BY X-RAY-FLUORESCENCE
PATTON, JA
GIBBS, SJ
PRICE, RR
BRILL, AB
JOURNAL OF NUCLEAR MEDICINE, 1978, 19 (12) : 1337 - 1338
[40] X-RAY-FLUORESCENCE ANALYSIS OF HETEROGENEOUS MATERIAL - EFFECTS OF GEOMETRY AND SECONDARY FLUORESCENCE
GARDNER, RP
BETEL, D
VERGHESE, K
INTERNATIONAL JOURNAL OF APPLIED RADIATION AND ISOTOPES, 1973, 24 (03): : 135 - 146

← 1 2 3 4 5 →