COMPARATIVE TESTS OF NEUTRON MONOCHROMATORS USING ELASTICALLY BENT SILICON AND MOSAIC CRYSTALS

被引:22
|
作者
KULDA, J
WAGNER, V
MIKULA, P
SAROUN, J
机构
[1] PHYS TECH BUNDESANSTALT,D-38116 BRAUNSCHWEIG,GERMANY
[2] NUCL PHYS INST,CS-25068 PRAGUE,CZECH REPUBLIC
关键词
D O I
10.1016/0168-9002(94)90162-7
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The performance of elastically bent perfect (Si) and mosaic (Cu, Ge) monochromator crystals is compared in the range of neutron wavelengths between 0.8 and 1.4 Angstrom in terms of neutron beam flux delivered at sample position as well as in terms of resolution in powder diffraction spectra recorded with an Al2O3 standard. The reflectivities of the mosaic crystals are found to be a factor 2-3 less than those predicted by mosaic model calculations neglecting primary extinction. The elastically bent Si crystals provide fluxes comparable or better than those of the germanium crystals of the same thickness. At the same time their effective mosaicity remains about three times lower, a fact that leads to improved resolution in the high-angle part of the powder spectra.
引用
收藏
页码:60 / 64
页数:5
相关论文
共 39 条
  • [21] MULTIPLE DIFFRACTION LINES IN THE SYNCHROTRON X-RAY TOPOGRAPHS OF ELASTICALLY BENT SILICON SINGLE-CRYSTALS
    TUOMI, T
    NAUKKARINEN, K
    PHYSICAL REVIEW B, 1981, 24 (10): : 6125 - 6128
  • [22] DEFLECTION OF HIGH-ENERGY CHANNELED CHARGED-PARTICLES BY ELASTICALLY BENT SILICON SINGLE-CRYSTALS
    GIBSON, WM
    KIM, IJ
    PISHARODY, M
    SALMAN, SM
    SUN, CR
    WANG, GH
    WIJAYAWARDANA, R
    FORSTER, JS
    MITCHELL, IV
    NIGMANOV, TS
    TSYGANOV, EN
    BAKER, SI
    CARRIGAN, RA
    TOOHIG, TE
    AVDEICHIKOV, VV
    ELLISON, JA
    SIFFERT, P
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 2 (1-3): : 54 - 59
  • [23] DECHANNELING STUDIES OF PLANAR CHANNELED PARTICLES IN ELASTICALLY BENT SILICON-CRYSTALS FOR LOW VALUES OF PV/R
    SUN, CR
    GIBSON, WM
    KIM, IJ
    WANG, GH
    BULGAKOV, NK
    FILATOVA, NA
    FORYCKI, A
    GOLOVATYUK, VM
    GUZIK, Z
    KADYROV, RB
    NIGMANOV, TS
    RIABTSOV, VD
    SADOVSKY, AB
    SHAFRANOV, MD
    TYAPKIN, IA
    TSYGANOV, EN
    VODOPIANOV, AS
    WOJTKOWSKA, J
    ZIMIN, NI
    CARRIGAN, RA
    TOOHIG, TE
    BAVIZHEV, MD
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 2 (1-3): : 60 - 62
  • [24] STUDIES OF THE BEHAVIOR OF A REACTOR NEUTRON BEAM AT THE SAMPLE POSITION OF A DIFFRACTOMETER USING SILICON MONOCHROMATORS
    AHMED, FU
    AHSAN, MH
    KHAN, AA
    KAMAL, I
    AWAL, MA
    AHMAD, AAZ
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1992, 63 (03): : 333 - 344
  • [25] On the possibility of using bent perfect crystals in TOF neutron scattering devices
    Mikula, P
    Furusaka, M
    Haryo, S
    Yasushige, Y
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2002, 74 (Suppl 1): : S207 - S209
  • [26] On the possibility of using bent perfect crystals in TOF neutron scattering devices
    P. Mikula
    M. Furusaka
    S. Haryo
    Y. Yasushige
    Applied Physics A, 2002, 74 : s207 - s209
  • [27] EXPERIMENTAL AND THEORETICAL-STUDY OF BRAGG REFLECTION OF X-RAYS FROM ELASTICALLY BENT SILICON-CRYSTALS
    GABRIELYAN, KT
    KISLOVSKII, EN
    PROKOPENKO, IV
    CHUKHOVSKII, FN
    FIZIKA TVERDOGO TELA, 1986, 28 (10): : 2935 - 2940
  • [28] Structural analysis of elastically bent organic crystals using in situ indentation and micro-Raman spectroscopy
    Mishra, Manish Kumar
    Mishra, Kamini
    Asif, S. A. Syed
    Manimunda, Praveena
    CHEMICAL COMMUNICATIONS, 2017, 53 (97) : 13035 - 13038
  • [29] Proton extraction from the CERN SPS using bent silicon crystals
    Elsener, K
    Fidecaro, G
    Gyr, M
    Herr, W
    Klem, J
    Mikkelsen, U
    Moller, SP
    Uggerhoj, E
    Vuagnin, G
    Weisse, E
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1996, 119 (1-2): : 215 - 230
  • [30] EFFECT OF TWISTING OF THE DIFFRACTION NET PLANES ON THE INTEGRAL INTENSITIES AT LAUE DIFFRACTION OF X-RAYS IN ELASTICALLY BENT SILICON-CRYSTALS
    DATSENKO, LI
    KISLOVSKII, EN
    KHRUPA, VI
    SHEVTSOVKAZMIRCHUK, KM
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 78 (02): : K175 - K178