NEW SPECIMEN PREPARATION TECHNIQUE FOR SCANNING ELECTRON-MICROSCOPE

被引：5

作者：

WONG, KY

TOVEY, NK

机构：

[1] CAMBRIDGE UNIV,ENGN DEPT,CAMBRIDGE,ENGLAND

[2] UNIV E ANGLIA,SCH ENVIRONM SCI,NORWICH,ENGLAND

来源：

GEOTECHNIQUE | 1975年 / 25卷 / 01期

关键词：

D O I：

10.1680/geot.1975.25.1.142

中图分类号：

P5 [地质学];

学科分类号：

0709 ; 081803 ;

摘要：

引用

页码：142 / 145

页数：4

共 50 条

[21] NEW APPROACH TO SCANNING ELECTRON-MICROSCOPE
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[22] NEW APPROACH TO SCANNING ELECTRON-MICROSCOPE
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[23] MEASUREMENT OF SMALL ROUGHNESS OF SPECIMEN SURFACE BY SCANNING ELECTRON-MICROSCOPE
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[25] TECHNIQUE FOR QUANTITATIVE-ANALYSIS OF SPECIMEN MICROTOPOGRAPHY USING COMPUTER CONTROL OF A SCANNING ELECTRON-MICROSCOPE
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[29] SCANNING ELECTRON-MICROSCOPE
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[30] A METHOD OF SPECIMEN PREPARATION FOR ELECTRON-MICROSCOPE OBSERVATION OF ALLOPHANE PARTICLES
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