REDUCED ABERRATIONS IN AN ELECTRON MATRIX LENS THROUGH THE USE OF OFFSET APERTURES

被引：5
|
作者：
KURIHARA, K
机构：
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1986年 / 4卷 / 05期
关键词：
D O I：
10.1116/1.583490
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1251 / 1255
页数：5
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