SI DOPANT MIGRATION AND THE ALGAAS/GAAS INVERTED INTERFACE

被引:78
|
作者
PFEIFFER, L [1 ]
SCHUBERT, EF [1 ]
WEST, KW [1 ]
MAGEE, CW [1 ]
机构
[1] EVANS E INC,PLAINSBORO,NJ 08536
关键词
D O I
10.1063/1.104915
中图分类号
O59 [应用物理学];
学科分类号
摘要
Electron transport in quantum well modulation delta-doped on either the normal or the inverted side has revealed the major cause of the long-puzzling inferior transport characteristics of the inverted interface. For growth conditions optimized for best transport with normal-side doping,we find migration of the Si dopant toward the inverted interface during growth to be the primary reason for the reduced inverted well mobility. This new understanding has allowed us to grow modulation-doped inverted quantum wells of unprecedented quality having electron mobilities as high as 2.4 x 10(6) cm2/V s at 4.2 K and 3.0 x 10(6) cm2/V s at 1.0 K.
引用
收藏
页码:2258 / 2260
页数:3
相关论文
共 50 条
  • [41] INTERFACE STATES OF MODULATION-DOPED ALGAAS/GAAS HETEROSTRUCTURES
    CHUNG, SK
    WU, Y
    WANG, KL
    SHENG, NH
    LEE, CP
    MILLER, DL
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1987, 34 (02) : 149 - 153
  • [42] Photoluminescence investigations of amphoteric behavior of Si-dopant in GaAs
    Galiev, GB
    Karachevtseva, MV
    Mokerov, VG
    Strakhov, VA
    Yaremenko, NG
    DOKLADY AKADEMII NAUK, 1999, 367 (05) : 613 - 616
  • [43] Si δ-doped GaAs structure with different dopant distribution models
    Ozturk, E., 1600, American Institute of Physics Inc. (91):
  • [44] Interface of wet oxidized AlGaAs/GaAs distributed Bragg reflectors
    R.Y. Li
    Z.G. Wang
    B. Xu
    P. Jin
    X. Guo
    M. Chen
    Applied Physics A, 2007, 86 : 19 - 22
  • [45] Confined and Interface Phonons in Chirped GaAs-AlGaAs Superlattices
    Hu Yong-Zheng
    Liu Feng-Qi
    Wang Li-Jun
    Liu Jun-Qi
    Wang Zhan-Guo
    CHINESE PHYSICS LETTERS, 2014, 31 (06)
  • [46] FORMATION OF THE INTERFACE BETWEEN GAAS AND SI - IMPLICATIONS FOR GAAS-ON-SI HETEROEPITAXY
    BRINGANS, RD
    OLMSTEAD, MA
    UHRBERG, RIG
    BACHRACH, RZ
    APPLIED PHYSICS LETTERS, 1987, 51 (07) : 523 - 525
  • [47] Photoacoustic determination of the recombination velocity at the AlGaAs/GaAs heterostructure interface
    Reich, I
    Díaz, P
    Prutskij, T
    Mendoza, J
    Vargas, H
    Marín, E
    JOURNAL OF APPLIED PHYSICS, 1999, 86 (11) : 6222 - 6229
  • [48] Correlation of the physical properties and the interface morphology of AlGaAs/GaAs heterostructures
    Gottwaldt, L. (ernst.o.goebel@ptb.de), 1600, American Institute of Physics Inc. (94):
  • [49] Correlation of the physical properties and the interface morphology of AlGaAs/GaAs heterostructures
    Gottwaldt, L
    Pierz, K
    Ahlers, FJ
    Göbel, EO
    Nau, S
    Torunski, T
    Stolz, W
    JOURNAL OF APPLIED PHYSICS, 2003, 94 (04) : 2464 - 2472
  • [50] BONDING STATE IN GAAS/SI INTERFACE
    WU, H
    LI, ZP
    HO, W
    VACUUM, 1992, 43 (11) : 1159 - 1160