ON-CHIP PICOSECOND TIME-DOMAIN MEASUREMENTS FOR VLSI AND INTERCONNECT TESTING USING PHOTOCONDUCTORS

被引：6
|
作者：
EISENSTADT, WR
HAMMOND, RB
DUTTON, RW
机构：
[1] STANFORD UNIV, INTEGRATED CIRCUITS LAB, STANFORD, CA 94305 USA
[2] UNIV CALIF LOS ALAMOS NATL LAB, DIV ELECTR, LOS ALAMOS, NM 87545 USA
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 1985年 / 32卷 / 02期
关键词：
D O I：
10.1109/T-ED.1985.21950
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：364 / 369
页数：6
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