STRUCTURAL-ANALYSIS OF SILICON AND AMORPHOUS-SILICON DOPED WITH SEVERAL ELEMENTS BY RAMAN-SPECTROSCOPY

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作者：
HUONG, PV
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来源：
ANNALES DE CHIMIE-SCIENCE DES MATERIAUX | 1983年 / 8卷 / 1-2期
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O6 [化学];
学科分类号：
0703 ;
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页码：73 / 87
页数：15
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