QUANTITATIVE MEASUREMENT OF THE VIBRATIONAL AMPLITUDE AND PHASE IN PHOTOREFRACTIVE TIME-AVERAGE INTERFEROMETRY - A COMPARISON WITH ELECTRONIC SPECKLE PATTERN INTERFEROMETRY

被引：7
|
作者：
ROHLEDER, H
PETERSEN, PM
MARRAKCHI, A
机构：
[1] OPT & FLUID DYNAM DEPT,DK-4000 ROSKILDE,DENMARK
[2] SIEMENS CORP RES,PRINCETON,NJ 08540
来源：
JOURNAL OF APPLIED PHYSICS | 1994年 / 76卷 / 01期
基金：
美国国家科学基金会;
关键词：
D O I：
10.1063/1.357063
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Time-average interferometry is dealt with using four-wave mixing in photorefractive Bi12SiO20. By introducing a proper sinusoidal phase shift in the forward pump beam it is possible to measure the amplitude and phase everywhere on a vibrating object. Quantitative measurements of the phase and amplitude of the vibrating structure are demonstrated in photorefractive time average interferometry. The photorefractive interferometer is compared with the performance of a commercial electronic speckle pattern interferometer (ESPI). It is shown that the dynamic photorefractive holographic interferometer improves the image quality considerably and is able to extend the measurable range for the acoustic vibration amplitude and frequency compared to what is obtainable with the ESPI equipment.
引用
收藏
页码：81 / 84
页数：4
相关论文
共 50 条
  • [31] Novel phase-locked electronic speckle pattern interferometry
    Yue, KD
    Zhang, F
    Wang, CS
    Tan, YS
    INTERNATIONAL CONFERENCE ON EXPERIMENTAL MECHANICS: ADVANCES AND APPLICATIONS, 1997, 2921 : 390 - 392
  • [32] DETERMINATION OF VIBRATION PHASE WITH ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (ESPI)
    VALERA, JD
    DOVAL, AF
    JONES, JDC
    ELECTRONICS LETTERS, 1992, 28 (25) : 2292 - 2294
  • [33] VIBRATION PHASE MAPPING USING ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
    LOKBERG, OJ
    HOGMOEN, K
    APPLIED OPTICS, 1976, 15 (11): : 2701 - 2704
  • [34] Phase-shifting algorithms for electronic speckle pattern interferometry
    Kao, Chih-Cheng
    Yeh, Gym-Bin
    Lee, Shu-Sheng
    Lee, Chih-Kung
    Yang, Ching-Sang
    Wu, Kuang-Chong
    Applied Optics, 2002, 41 (01): : 46 - 54
  • [35] Deep Learning in the Phase Extraction of Electronic Speckle Pattern Interferometry
    Jiang, Wenbo
    Ren, Tong
    Fu, Qianhua
    ELECTRONICS, 2024, 13 (02)
  • [36] Phase-shifting algorithms for electronic speckle pattern interferometry
    Kao, CC
    Yeh, GB
    Lee, SS
    Lee, CK
    Yang, CS
    Wu, KC
    APPLIED OPTICS, 2002, 41 (01) : 46 - 54
  • [37] Effect of wavefront divergence in the quantitative measurement analysis of electronic speckle pattern shearing interferometry (ESPSI)
    Abdullah, WSW
    Petzing, JN
    Tyrer, JR
    THIRD INTERNATIONAL CONFERENCE ON EXPERIMENTAL MECHANICS AND THIRD CONFERENCE OF THE ASIAN-COMMITTEE-ON-EXPERIMENTAL-MECHANICS, PTS 1AND 2, 2005, 5852 : 578 - 585
  • [38] Random phase measurement errors in digital speckle pattern interferometry
    Huntley, JM
    OPTICS AND LASERS IN ENGINEERING, 1997, 26 (2-3) : 131 - 150
  • [39] Quantitative measurement of displacement in photopolymer layers during holographic recording using phase shifting electronic speckle pattern interferometry
    Moothanchery, Mohesh
    Bavigadda, Viswanath
    Upputuri, Paul Kumar
    Pramanik, Manojit
    Toal, Vincent
    Naydenova, Izabela
    QUANTITATIVE PHASE IMAGING II, 2016, 9718
  • [40] In-plane, out-of-plane, and time-average speckle interferometry experiments with a digital photocamera
    Vannoni, M
    Molesini, G
    OPTO-IRELAND 2005: PHOTONIC ENGINEERING, 2005, 5827 : 617 - 626
12345