FROZEN EPOXY-RESIN CRACKING METHOD FOR SCANNING ELECTRON-MICROSCOPY

被引：0
|
作者：
SHIMADA, T [1 ]
MURAKAMI, M [1 ]
机构：
[1] KURUME UNIV,SCH MED,DEPT ANAT 2,KURUME,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1975年 / 24卷 / 03期
关键词：
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
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页码：199 / 199
页数：1
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