IN-SITU CHARACTERIZATION OF THE LIQUID-SOLID INTERFACE BY SCANNING-TUNNELING-MICROSCOPY

被引：0

作者：

KIM, JC ^{[1
]}

KHANG, YH ^{[1
]}

SHIM, TE ^{[1
]}

LEE, DH ^{[1
]}

JEON, D ^{[1
]}

KUK, Y ^{[1
]}

机构：

[1] SEOUL NATL UNIV,DEPT PHYS,SAN 56-1,SEOUL,SOUTH KOREA

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1994年 / 12卷 / 03期

关键词：

D O I：

10.1116/1.587284

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A chemical cell with sorption and turbomolecular pumps was attached to an ultrahigh vacuum (UHV) scanning tunneling microscopy (STM) chamber to study the structure of surfaces etched or passivated by various chemicals. This system allows us to study various liquid-solid interfaces with little or no contamination that usually occurs in ambient pressure STM or during transportation of a sample in the air. Silicon surfaces treated by dilute HF, mixed solution of HF with NH4F and KOH were imaged by a UHV STM, revealing different surface structures. This system can be used as a new device for characterization of liquid-solid interfaces.

引用

页码：1551 / 1554

页数：4

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