ELECTRON-TRANSPORT PROPERTIES OF THIN COPPER-FILMS .1.

被引：75
|
作者：
SURI, R [1 ]
THAKOOR, AP [1 ]
CHOPRA, KL [1 ]
机构：
[1] INDIAN INST TECHNOL,DEPT PHYS,NEW DELHI 29,INDIA
来源：
JOURNAL OF APPLIED PHYSICS | 1975年 / 46卷 / 06期
关键词：
D O I：
10.1063/1.321934
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：2574 / 2582
页数：9
相关论文
共 50 条
  • [21] ELECTRON-TRANSPORT SYSTEM OF VIBRIO SUCCINOGENES .1. ENZYMES AND CYTOCHROMES OF ELECTRON-TRANSPORT SYSTEM
    JACOBS, NJ
    WOLIN, MJ
    BIOCHIMICA ET BIOPHYSICA ACTA, 1963, 69 (01) : 18 - &
  • [22] DIRECT MEASUREMENTS OF THE LOCAL ELECTRON-TRANSPORT PROPERTIES IN YBACUO SUPERCONDUCTING THIN-FILMS
    KENT, AD
    MAGGIOAPRILE, I
    NIEDERMANN, P
    RENNER, C
    TRISCONE, JM
    KARKUT, MG
    BRUNNER, O
    ANTOGNAZZA, L
    FISCHER, O
    PHYSICA C, 1989, 162 : 1035 - 1036
  • [23] ELLIPSOMETRIC STUDIES ON THE OXIDATION OF THIN COPPER-FILMS
    RAUH, M
    WISSMANN, P
    WOLFEL, M
    THIN SOLID FILMS, 1993, 233 (1-2) : 289 - 292
  • [24] STRUCTURE AND ELECTRICAL-PROPERTIES OF THIN COPPER-FILMS DEPOSITED BY MOCVD
    ROBER, J
    KAUFMANN, C
    GESSNER, T
    APPLIED SURFACE SCIENCE, 1995, 91 (1-4) : 134 - 138
  • [25] THE INTERACTION OF ATOMIC OXYGEN WITH THIN COPPER-FILMS
    GIBSON, BC
    WILLIAMS, JR
    FROMHOLD, AT
    BOZACK, MJ
    NEELY, WC
    WHITAKER, AF
    JOURNAL OF CHEMICAL PHYSICS, 1992, 96 (03): : 2318 - 2323
  • [26] MECHANICAL-PROPERTIES OF COPPER-FILMS
    CHOURASIA, NC
    KALKUNDRI, SB
    GADGEEL, VL
    CRYSTAL RESEARCH AND TECHNOLOGY, 1993, 28 (04) : 539 - 542
  • [27] POINT CONTACT SPECTROSCOPY OF THIN COPPER-FILMS
    BALKASHIN, OP
    PILIPENKO, YA
    FIZIKA TVERDOGO TELA, 1991, 33 (09): : 2584 - 2593
  • [28] STRAIN COEFFICIENT OF RESISTANCE OF THIN COPPER-FILMS
    WARKUSZ, F
    THIN SOLID FILMS, 1977, 41 (03) : 261 - 269
  • [29] THERMOELECTRIC-POWER OF THIN COPPER-FILMS
    LEONARD, WF
    YU, HY
    JOURNAL OF APPLIED PHYSICS, 1973, 44 (12) : 5320 - 5323
  • [30] LOCALIZATION AND NEGATIVE MAGNETORESISTANCE IN THIN COPPER-FILMS
    VANHAESENDONCK, C
    VANDENDRIES, L
    BRUYNSERAEDE, Y
    DEUTSCHER, G
    PHYSICAL REVIEW B, 1982, 25 (08): : 5090 - 5096
12345