共 50 条
- [41] FUNDAMENTALS OF TRANSMISSION ELECTRON-MICROSCOPY MEMOIRES SCIENTIFIQUES DE LA REVUE DE METALLURGIE, 1965, 62 (03): : 255 - &
- [43] APPLICATIONS OF TRANSMISSION ELECTRON-MICROSCOPY IN CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS JOURNAL OF ELECTRON MICROSCOPY, 1977, 26 (02): : 182 - 182
- [46] BEHAVIOR OF PLASMA-SPRAYED TIC COATINGS UNDER ELECTRON-BEAM THERMAL SHOCKS JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1985, 3 (06): : 2503 - 2505
- [47] CHARACTERIZATION OF THE GAP/SI(001) INTERFACE BY TRANSMISSION ELECTRON-MICROSCOPY ELECTRON MICROSCOPY AND ANALYSIS 1993, 1993, (138): : 317 - 320
- [48] CHARACTERIZATION OF LAYERED SYNTHETIC MICROSTRUCTURES USING TRANSMISSION ELECTRON-MICROSCOPY JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1985, 2 (08): : 1356 - 1362
- [49] CHARACTERIZATION OF SMALL PERFECT DISLOCATION LOOPS BY TRANSMISSION ELECTRON-MICROSCOPY PHILOSOPHICAL MAGAZINE, 1972, 26 (05): : 1233 - &
- [50] CHARACTERIZATION BY TRANSMISSION ELECTRON-MICROSCOPY OF WEDGE SHAPED SEMICONDUCTOR SAMPLES JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1989, 14 (06): : 407 - &