ON THE MEASUREMENT OF CONDUCTION CURRENT IN AC THIN-FILM ELECTROLUMINESCENT DISPLAY DEVICES

被引：4
|
作者：
SINGH, VP [1 ]
MORTON, DC [1 ]
机构：
[1] USA,ELECTR RES & DEV COMMAND,ELECTR TECHNOL & DEVICES LAB,DISPLAYS GRP,FT MONMOUTH,NJ 07703
来源：
IEEE ELECTRON DEVICE LETTERS | 1990年 / 11卷 / 12期
基金：
美国国家科学基金会;
关键词：
D O I：
10.1109/55.63043
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Estimates are obtained for errors associated with the use of a capacitive bridge method for the measurement of the conduction current-time waveform in ac thin-film electroluminescent (ACTFEL) display devices. The error is a function of the shape and the slew rate of the excitation voltage pulses and can be quite large. In general, the bridge method underestimates the value of conduction current. An improved technique for measuring the current waveform is outlined. The new method is more accurate and is more generally applicable. © 1990 IEEE
引用
收藏
页码：573 / 575
页数：3
相关论文
共 50 条
  • [31] APPLICATION OF THIN-FILM ELECTROLUMINESCENT DEVICES
    THEIS, D
    JOURNAL OF LUMINESCENCE, 1981, 23 (1-2) : 191 - 207
  • [32] MEMORY IN THIN-FILM ELECTROLUMINESCENT DEVICES
    HOWARD, WE
    JOURNAL OF LUMINESCENCE, 1981, 23 (1-2) : 155 - 173
  • [33] MEASURING ON THIN-FILM ELECTROLUMINESCENT DEVICES
    MULLER, GO
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1993, 139 (01): : 271 - 278
  • [34] THIN-FILM ELECTROLUMINESCENT DISPLAY UNITS.
    Uede, Hisashi
    Kanatani, Yoshiharu
    Kishishita, Hiroshi
    Fujimori, Akira
    Okano, Kohsaku
    Denshi Tokyo/Electron Tokyo, 1981, (20): : 38 - 41
  • [35] Etching of AC thin film electroluminescent devices
    Stevens, R
    McClean, IP
    Craven, MR
    IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 1996, 9 (02) : 241 - 248
  • [36] Hot electron excitation of luminescent impurities in AC thin-film electroluminescent devices
    Pennathur, S
    Lee, I
    Reigrotzki, M
    Redmer, R
    Streicher, K
    Plant, TK
    Wager, JF
    Vogl, P
    Goodnick, SM
    HOT CARRIERS IN SEMICONDUCTORS, 1996, : 373 - 376
  • [37] AC THIN-FILM ELECTROLUMINESCENT DEVICES WITH RARE-EARTH DOPED ZNS
    JAYARAJ, MK
    VALLABHAN, CPG
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1991, 138 (05) : 1512 - 1516
  • [38] EXCITATION AND DEEXCITATION OF AC-DRIVEN THIN-FILM ZNS ELECTROLUMINESCENT DEVICES
    SOHN, SH
    HAMAKAWA, Y
    JOURNAL OF APPLIED PHYSICS, 1992, 72 (06) : 2492 - 2504
  • [39] A METHOD FOR EVALUATING THE FREQUENCY-CHARACTERISTICS OF AC THIN-FILM ELECTROLUMINESCENT DEVICES
    WANG, ZX
    CARDON, F
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1995, 28 (10) : 2144 - 2149
  • [40] MECHANISMS OF THE NEGATIVE-RESISTANCE CHARACTERISTICS IN AC THIN-FILM ELECTROLUMINESCENT DEVICES
    YANG, KWC
    OWEN, SJT
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1983, 30 (05) : 452 - 459
12345