ON THE STATISTICAL-ANALYSIS OF IMAGES IN LOW-DOSE ELECTRON-MICROSCOPY

被引：0
|
作者：
SLUMP, CH
FERWERDA, HA
HOENDERS, BJ
机构：
[1] STATE UNIV GRONINGEN,DEPT APPL PHYS,9747 AG GRONINGEN,NETHERLANDS
[2] PHILIPS MED SYST DIV,PROD GRP IMAGING,GRONINGEN,NETHERLANDS
来源：
ULTRAMICROSCOPY | 1984年 / 15卷 / 04期
关键词：
D O I：
10.1016/0304-3991(84)90134-7
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：377 / 378
页数：2
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