ON THE STATISTICAL-ANALYSIS OF IMAGES IN LOW-DOSE ELECTRON-MICROSCOPY

被引：0

作者：

SLUMP, CH

FERWERDA, HA

HOENDERS, BJ

机构：

[1] STATE UNIV GRONINGEN,DEPT APPL PHYS,9747 AG GRONINGEN,NETHERLANDS

[2] PHILIPS MED SYST DIV,PROD GRP IMAGING,GRONINGEN,NETHERLANDS

来源：

ULTRAMICROSCOPY | 1984年 / 15卷 / 04期

关键词：

D O I：

10.1016/0304-3991(84)90134-7

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：377 / 378

页数：2

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