Trade show demonstrations and US patent infringement

被引：0

|

作者：

Barry, Kathleen B. ^{[1
]}

Poullaos, Ivan M. ^{[1
]}

机构：

[1] Winston & Strawn LLP, Chicago, IL 60601 USA

来源：

JOURNAL OF INTELLECTUAL PROPERTY LAW & PRACTICE | 2009年 / 4卷 / 03期

关键词：

D O I：

10.1093/jiplp/jpn255

中图分类号：

D9 [法律]; DF [法律];

学科分类号：

0301 ;

摘要：

引用

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页码：153 / 154

页数：3

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