AUTOMATIC C-V PLOTTER

被引:9
|
作者
FORWARD, KE [1 ]
HASEGAWA, H [1 ]
HARTNAGEL, HL [1 ]
机构
[1] MERZ LABS, DEPT ELECT & ELECTR ENGN, NEWCASTLE UPON TYNE NE1 7RU, ENGLAND
来源
关键词
D O I
10.1088/0022-3735/8/6/017
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:487 / 489
页数:3
相关论文
共 50 条
  • [21] Rapid and Accurate C-V Measurements
    Kim, Ji-Hong
    Shrestha, Pragya R.
    Campbell, Jason P.
    Ryan, Jason T.
    Nminibapiel, David
    Kopanski, Joseph J.
    Cheung, Kin P.
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016, 63 (10) : 3851 - 3856
  • [22] MOS capacitor C-V Curves
    Feng, Lu
    Chen, Jihua
    2005 International Symposium on Computer Science and Technology, Proceedings, 2005, : 506 - 513
  • [23] Fundamentals of Semiconductor C-V Measurements
    Stauffer, Lee
    EE-EVALUATION ENGINEERING, 2008, 47 (12): : 20 - +
  • [24] LINEAR GENERATOR FOR C-V METERS
    PETROV, VY
    POPOV, VV
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1990, 33 (01) : 111 - 112
  • [25] C-V UNIFORMITY MEASUREMENTS.
    Deming, R.O.
    Keenan, W.A.
    1600, (B6): : 1 - 2
  • [26] POISSON C-V PROFILER.
    Blacksin, Jeffrey M.
    IEEE Transactions on Electron Devices, 1986, ED-33 (09) : 1387 - 1389
  • [27] C-V TECHNIQUE AS AN ANALYTICAL TOOL
    ZAININGER, KH
    HEIMAN, FP
    SOLID STATE TECHNOLOGY, 1970, 13 (06) : 46 - +
  • [28] Taking the mystery out of C-v
    Fleischer, H
    HYDRAULICS & PNEUMATICS, 1996, 49 (01) : 145 - &
  • [29] C-V and V-C Co-articulation in Cantonese
    Lee, Wai-Sum
    STUDIES ON SPEECH PRODUCTION, 2018, 10733 : 111 - 120
  • [30] Automatic statistical full quantum analysis of C-V and I-V characteristics for advanced MOS gate stacks
    Leroux, C.
    Allain, F.
    Toffoli, A.
    Ghibaudo, G.
    Reimbold, G.
    MICROELECTRONIC ENGINEERING, 2007, 84 (9-10) : 2408 - 2411