BILINEAR SYSTEM-ANALYSIS FOR MICRODENSITOMETERS

被引：2
|
作者：
SHENG, Y [1 ]
DUVERNOY, J [1 ]
机构：
[1] UNIV FRANCHE COMTE,FAC SCI & TECH,CNRS OPT PM DUFFIEUX LAB 214,F-25030 BESANCON,FRANCE
来源：
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1986年 / 3卷 / 08期
关键词：
D O I：
10.1364/JOSAA.3.001320
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：1320 / 1325
页数：6
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