CHARGING EFFECT IN X-RAY PHOTOELECTRON SPECTROMETRY

被引：63

作者：

EBEL, MF ^{[1
]}

EBEL, H ^{[1
]}

机构：

[1] TH VIENNA,INST TECH PHYS,KARLSPLATZ 13,A-1040 VIENNA,AUSTRIA

来源：

关键词：

D O I：

10.1016/0368-2048(74)80008-3

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：169 / 180

页数：12

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