INFLUENCE OF STEP AT THE EDGE OF ITO ELECTRODE ON BREAKDOWN VOLTAGE OF AC THIN-FILM EL

被引：0

作者：

SATO, S ^{[1
]}

WAKITANI, M ^{[1
]}

OKAMOTO, K ^{[1
]}

TAKAHARA, K ^{[1
]}

MIURA, S ^{[1
]}

ANDOH, S ^{[1
]}

机构：

[1] FUJITSU LABS LTD,ATSUGI,KANAGAWA 24301,JAPAN

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1984年 / 131卷 / 08期

关键词：

D O I：

暂无

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：C326 / C326

页数：1

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