INFLUENCE OF STEP AT THE EDGE OF ITO ELECTRODE ON BREAKDOWN VOLTAGE OF AC THIN-FILM EL

被引：0
|
作者：
SATO, S [1 ]
WAKITANI, M [1 ]
OKAMOTO, K [1 ]
TAKAHARA, K [1 ]
MIURA, S [1 ]
ANDOH, S [1 ]
机构：
[1] FUJITSU LABS LTD,ATSUGI,KANAGAWA 24301,JAPAN
来源：
JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1984年 / 131卷 / 08期
关键词：
D O I：
暂无
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
引用
收藏
页码：C326 / C326
页数：1
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