SCATTERING OF EM RADIATION AT AG FILMS DUE TO SURFACE-ROUGHNESS

被引:0
|
作者
CHEN, WP [1 ]
TALAAT, H [1 ]
BURSTEIN, E [1 ]
机构
[1] UNIV PENN,PHILADELPHIA,PA
来源
关键词
D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:588 / 588
页数:1
相关论文
共 50 条
  • [21] MEASUREMENT OF SURFACE-ROUGHNESS BY LIGHT-SCATTERING METHOD
    THURN, G
    GAST, T
    TECHNISCHES MESSEN, 1985, 52 (02): : 74 - 78
  • [22] CHARACTERIZING GASTROLITH SURFACE-ROUGHNESS WITH LIGHT-SCATTERING
    JOHNSTON, RG
    MANLEY, K
    LEMANSKI, CL
    OPTICS COMMUNICATIONS, 1990, 74 (05) : 279 - 283
  • [23] ROLE OF SCATTERING BY SURFACE-ROUGHNESS IN SILICON INVERSION LAYERS
    CHENG, YC
    SULLIVAN, EA
    SURFACE SCIENCE, 1973, 34 (03) : 717 - 731
  • [24] NONSTATIONARY SURFACE-ROUGHNESS MEASUREMENT BY LIGHT-SCATTERING
    GRABE, M
    PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1972, 60 (03): : 339 - &
  • [25] SURFACE-ROUGHNESS INDUCED ELECTRONIC RAMAN-SCATTERING
    OTTO, A
    TIMPER, J
    BILLMANN, J
    KOVACS, G
    POCKRAND, I
    SURFACE SCIENCE, 1980, 92 (01) : L55 - L57
  • [26] EFFECTS OF SURFACE-ROUGHNESS AND SURFACE-FILMS ON CONTACT RESISTANCE
    HISAKADO, T
    WEAR, 1977, 44 (02) : 345 - 359
  • [27] REGIMES OF SURFACE-ROUGHNESS MEASURABLE WITH LIGHT-SCATTERING
    VORBURGER, TV
    MARX, E
    LETTIERI, TR
    APPLIED OPTICS, 1993, 32 (19): : 3401 - 3408
  • [28] SURFACE-ROUGHNESS AND OXIDE LAYERS OF SPUTTERED POLYCRYSTALLINE FILMS
    ROHLSBERGER, R
    GROTE, M
    BERGMANN, U
    GERDAU, E
    HOLLATZ, R
    RUFFER, R
    RUTER, HD
    STURHAHN, W
    HARSDORFF, M
    PFUTZNER, W
    X-RAY/EUV OPTICS FOR ASTRONOMY AND MICROSCOPY, 1989, 1160 : 26 - 36
  • [29] RBS SPECTRA FOR THIN-FILMS WITH SURFACE-ROUGHNESS
    SHORIN, VS
    SOSNIN, AN
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1992, 72 (3-4): : 452 - 456
  • [30] SURFACE-ROUGHNESS OF MO FILMS PREPARED BY MAGNETRON SPUTTERING
    HINO, T
    MAKABE, Y
    HIROHATA, Y
    YAMASHINA, T
    THIN SOLID FILMS, 1993, 229 (02) : 201 - 206