SCATTERING OF EM RADIATION AT AG FILMS DUE TO SURFACE-ROUGHNESS

被引：0
|
作者：
CHEN, WP [1 ]
TALAAT, H [1 ]
BURSTEIN, E [1 ]
机构：
[1] UNIV PENN,PHILADELPHIA,PA
来源：
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1975年 / 20卷 / 04期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：588 / 588
页数：1
相关论文
共 50 条
  • [1] SURFACE-ROUGHNESS AND CONDUCTIVITY OF THIN AG FILMS
    LUO, EZ
    HEUN, S
    KENNEDY, M
    WOLLSCHLAGER, J
    HENZLER, M
    PHYSICAL REVIEW B, 1994, 49 (07): : 4858 - 4865
  • [2] ABNORMAL OPTICAL-ABSORPTION OF QUENCHED AG FILMS DUE TO SURFACE-ROUGHNESS
    LOPEZRIOS, T
    VUYE, G
    BORENSZTEIN, Y
    SURFACE SCIENCE, 1983, 131 (01) : L367 - L372
  • [3] MEASUREMENT OF CORRELATION BETWEEN SPECULAR REFLECTANCE AND SURFACE-ROUGHNESS OF AG FILMS
    CUNNINGHAM, LJ
    BRAUDMEIER, AJ
    PHYSICAL REVIEW B, 1976, 14 (02): : 479 - 483
  • [4] STUDY OF THE SURFACE-ROUGHNESS FOR THIN-FILMS OF LIF AND AG/LIF
    VARNIER, F
    MAYANI, N
    RASIGNI, G
    RASIGNI, M
    LLEBARIA, A
    SURFACE SCIENCE, 1987, 188 (1-2) : 107 - 122
  • [5] SCATTERING OF CONDUCTION ELECTRONS BY SURFACE-ROUGHNESS IN THIN METAL-FILMS
    KASER, A
    GERLACH, E
    ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1995, 97 (01): : 139 - 146
  • [6] SURFACE-ROUGHNESS OF THIN-FILMS
    TROFIMOV, VI
    OSADCHENKO, VA
    SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1993, 60 (08): : 540 - 545
  • [7] INFLUENCE OF THIN-FILMS AND SURFACE-ROUGHNESS ON REFLECTION, TRANSMISSION AND SCATTERING OF LIGHT
    CROCE, P
    JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE, 1977, 8 (02): : 127 - 139
  • [8] SURFACE-ROUGHNESS SCATTERING OF ELECTRONS IN SEMICONDUCTORS AND SEMIMETALS
    MORE, RM
    JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1975, 8 (22): : 3810 - 3816
  • [9] A SCATTERING MODEL FOR NONDIFFERENTIABLE PERIODIC SURFACE-ROUGHNESS
    BISHOP, GC
    SMITH, J
    JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, 1992, 91 (02): : 744 - 770
  • [10] SURFACE-ROUGHNESS INDUCED SCATTERING AND BAND TAILING
    GOODNICK, SM
    GANN, RG
    FERRY, DK
    WILMSEN, CW
    KRIVANEK, OL
    SURFACE SCIENCE, 1982, 113 (1-3) : 233 - 238
12345