MEASUREMENT OF THE REFRACTIVE-INDEX PROFILE IN POLYCRYSTALLINE GERMANIUM-SILICON ALLOY GRIN CRYSTALS

被引：2

作者：

NAUGHTON, DP ^{[1
]}

MICELI, JJ ^{[1
]}

MOORE, DT ^{[1
]}

机构：

[1] UNIV ROCHESTER, INST OPT, GRADIENT INDEX LAB, ROCHESTER, NY 14627 USA

来源：

APPLIED OPTICS | 1988年 / 27卷 / 03期

关键词：

D O I：

10.1364/AO.27.000505

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：505 / 507

页数：3

共 50 条

[31] Refractive-index profile of fiber optics
Hindy, MA
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2001, 29 (04) : 252 - 256
[32] Refractive-index profile is measured nondestructively
Overton, G
LASER FOCUS WORLD, 2005, 41 (07): : 15 - 16
[33] REFRACTIVE-INDEX PROFILE MEASUREMENT OF PREFORM RODS BY A TRANSVERSE DIFFERENTIAL INTERFEROGRAM
KOKUBUN, Y
IGA, K
APPLIED OPTICS, 1980, 19 (06): : 846 - 851
[34] NUMERICAL RECONSTRUCTION OF THE REFRACTIVE-INDEX PROFILE FROM TRANSVERSE MEASUREMENT DATA
ROGUS, D
FIBER AND INTEGRATED OPTICS, 1991, 10 (01) : 65 - 74
[35] REFRACTIVE-INDEX PROFILE MEASUREMENT OF COMPOUND THIN-FILMS BY ELLIPSOMETRY
HO, JH
LEE, CL
LEI, TF
ELECTRONICS LETTERS, 1989, 25 (16) : 1084 - 1086
[36] NEW TECHNIQUE FOR REFRACTIVE-INDEX PROFILE MEASUREMENT IN MULTIMODE OPTICAL FIBERS
SUMMER, GT
OPTICAL AND QUANTUM ELECTRONICS, 1977, 9 (01) : 79 - 82
[37] NONDESTRUCTIVE REFRACTIVE-INDEX PROFILE MEASUREMENT OF ELLIPTICAL OPTICAL FIBER OR PREFORM
CHU, PL
ELECTRONICS LETTERS, 1979, 15 (12) : 357 - 358
[38] ADDITIONAL DATA ON REFRACTIVE-INDEX OF SILICON
VILLA, JJ
APPLIED OPTICS, 1972, 11 (09): : 2102 - &
[39] TEMPERATURE, LIGHT-INTENSITY AND MICROSTRUCTURE DEPENDENCE OF THE REFRACTIVE-INDEX OF POLYCRYSTALLINE SILICON FILMS
CHANDRASEKHAR, S
VENGURLEKAR, AS
KARULKAR, VT
ROY, SK
THIN SOLID FILMS, 1989, 169 (02) : 205 - 212
[40] MEASUREMENT OF THE REFRACTIVE-INDEX AND THERMAL REFRACTIVE-INDEX COEFFICIENTS OF ND-YAP CRYSTAL
ZENG, ZD
SHEN, HY
HUANG, ML
XU, H
ZENG, RR
ZHOU, YP
YU, GF
HUANG, CH
APPLIED OPTICS, 1990, 29 (09): : 1281 - 1286

← 1 2 3 4 5 →