DEPTH DISTRIBUTIONS AND RANGE PARAMETERS FOR HE IMPLANTED IN SI AND GAAS

被引:29
|
作者
WILSON, RG [1 ]
DELINE, VR [1 ]
HOPKINS, CG [1 ]
机构
[1] CHARLES EVANS & ASSOCIATES,SAN MATEO,CA 94402
关键词
D O I
10.1063/1.93339
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:929 / 931
页数:3
相关论文
共 50 条
  • [31] Activation modeling of Si implanted GaAs
    Apiwatwaja, R
    Gwilliam, R
    Wilson, R
    Sealy, BJ
    JOURNAL OF APPLIED PHYSICS, 1997, 81 (03) : 1131 - 1134
  • [32] A study of the evolution of carrier and vacancy depth profiles with annealing temperature of Si-implanted GaAs
    Knights, AP
    Apiwatwaja, R
    Gwilliam, R
    Sealy, BJ
    Coleman, PG
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1998, 13 (11) : 1266 - 1271
  • [33] Range parameters of 18O implanted into Si and SiO2
    de Souza, JP
    Behar, M
    Dias, JF
    dos Santos, JHR
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2001, 175 : 46 - 50
  • [34] CHROMIUM CONCENTRATIONS, DEPTH DISTRIBUTIONS, AND DIFFUSION-COEFFICIENT IN BULK AND EPITAXIAL GAAS AND IN SI
    WILSON, RG
    VASUDEV, PK
    JAMBA, DM
    EVANS, CA
    DELINE, VR
    APPLIED PHYSICS LETTERS, 1980, 36 (03) : 215 - 217
  • [35] Kinetics and depth distributions of oxygen implanted into Si analyzed by the Monte Carlo simulation of extended TRIM
    Yoneda, T
    Kajiyama, K
    Tohjou, F
    Yoshioka, Y
    Ikeda, A
    Kisaka, Y
    Nishimura, T
    Kido, Y
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1997, 36 (12A): : 7323 - 7328
  • [36] DEPTH DISTRIBUTIONS OF SULFUR IMPLANTED INTO GAAS AS A FUNCTION OF ION ENERGY, ION FLUENCE, AND ANNEALING TEMPERATURE AND ENCAPSULATION
    WILSON, RG
    JAMBA, DM
    DELINE, VR
    EVANS, CA
    PARK, YS
    JOURNAL OF APPLIED PHYSICS, 1983, 54 (07) : 3849 - 3854
  • [37] Study of optimal ion implanted layers for Si+ implanted Si-GaAs
    Li, Guohui
    Han, Dejun
    Chen, Ruyi
    Ji, Chengzhou
    Wang, Cehuan
    Xia, Deqian
    Zhu, Hongqing
    Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 1994, 15 (01): : 40 - 47
  • [38] RBS AND SIMS MEASUREMENTS OF THE FLUENCE DEPENDENCE OF THE RANGE DISTRIBUTIONS OF PB IMPLANTED INTO SI(111) CRYSTALS
    KOSTIC, S
    JIMENEZRODRIGUEZ, JJ
    ARMOUR, DG
    VACUUM, 1984, 34 (10-1) : 1021 - 1021
  • [39] EPR study of He-implanted Si
    Pivac, B
    Rakvin, B
    Tonini, R
    Corni, F
    Ottaviani, G
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2000, 73 (1-3): : 60 - 63
  • [40] Effect of pre-implanted oxygen in Si on the retention of implanted He
    Manuaba, A.
    Paszti, F.
    Ramos, A. R.
    Khanh, N. Q.
    Pecz, B.
    Zolnai, Z.
    Tunyogi, A.
    Szilagyi, E.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2006, 249 : 150 - 152