THE IMPLEMENTATION OF PHYSICAL BOUNDARY-CONDITIONS IN THE MONTE-CARLO SIMULATION OF ELECTRON DEVICES

被引:3
|
作者
WOOLARD, DL [1 ]
TIAN, H [1 ]
LITTLEJOHN, MA [1 ]
KIM, KW [1 ]
机构
[1] N CAROLINA STATE UNIV,DEPT ELECT & COMP ENGN,RALEIGH,NC 27695
关键词
D O I
10.1109/43.317467
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This paper investigates the problem of specifying and implementing physical boundary conditions for the Monte Carlo (MC) simulation of electron dynamics in semiconductor devices. The goal of this work is to establish an accurate and efficient ohmic boundary condition scheme for use in characterizing realistic device structures. In this work, three distinct physical models for specifying the boundary electrons at the ideal ohmic contacts of an N+ - N - N+ GaAs Ballistic diode structure are investigated. This study demonstrates that a displaced Maxwellian scheme, which allows for an electron ensemble with momentum space displacement and random spread, presents definite computational advantages when one is interested in resolving asymmetries in the electron distribution function throughout the semiconductor device structure.
引用
收藏
页码:1241 / 1246
页数:6
相关论文
共 50 条
  • [31] MONTE-CARLO SIMULATION OF HOT-ELECTRON SPECTRA
    BETON, PH
    LONG, AP
    KELLY, MJ
    SOLID-STATE ELECTRONICS, 1988, 31 (3-4) : 637 - 640
  • [32] SPIRALING ALGORITHM - COLLECTIVE MONTE-CARLO TRIAL AND SELF-DETERMINED BOUNDARY-CONDITIONS FOR INCOMMENSURATE SPIN SYSTEMS
    SASLOW, WM
    GABAY, M
    ZHANG, WM
    PHYSICAL REVIEW LETTERS, 1992, 68 (24) : 3627 - 3630
  • [33] MONTE-CARLO SIMULATION OF THE PHOTOELECTRON CROSSTALK IN SILICON IMAGING DEVICES
    LAVINE, JP
    CHANG, WC
    ANAGNOSTOPOULOS, CN
    BURKEY, BC
    NELSON, ET
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1985, 4 (04) : 531 - 535
  • [34] MONTE-CARLO SIMULATION OF NOISE IN GAAS SEMICONDUCTOR-DEVICES
    ADAMS, JG
    TANG, TW
    KAY, LE
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1994, 41 (04) : 575 - 581
  • [35] MONTE-CARLO SIMULATION OF CONTACTS IN SUB-MICRON DEVICES
    LUGLI, P
    RAVAIOLI, U
    FERRY, DK
    AIP CONFERENCE PROCEEDINGS, 1984, (122) : 162 - 166
  • [36] MONTE-CARLO SIMULATION OF CHARGE TRANSPORT IN SEMICONDUCTOR-DEVICES
    LUGLI, P
    MICROELECTRONIC ENGINEERING, 1992, 19 (1-4) : 275 - 282
  • [37] MONTE-CARLO SIMULATION OF THE PHOTOELECTRON CROSSTALK IN SILICON IMAGING DEVICES
    LAVINE, JP
    CHANG, WC
    ANAGNOSTOPOULOS, CN
    BURKEY, BC
    NELSON, ET
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (10) : 2087 - 2091
  • [38] DETERMINING UNCERTAINTY IN PHYSICAL PARAMETER MEASUREMENTS BY MONTE-CARLO SIMULATION
    COY, DW
    KEW, GA
    MULLINS, ME
    PISERCHIA, PV
    ACS SYMPOSIUM SERIES, 1986, 315 : 39 - 60
  • [39] THEORY AND MONTE-CARLO SIMULATION OF PHYSICAL CLUSTERS IN IMPERFECT VAPOR
    LEE, JK
    BARKER, JA
    ABRAHAM, FF
    JOURNAL OF CHEMICAL PHYSICS, 1973, 58 (08): : 3166 - 3180
  • [40] MONTE-CARLO SIMULATION OF WATER
    PANGALI, CS
    RAO, M
    BERNE, BJ
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1978, 175 (MAR): : 1 - 1