HIGH-RESOLUTION 400-KV ELECTRON-MICROSCOPE

被引：0

作者：

HONDA, T ^{[1
]}

IBE, K ^{[1
]}

SUZUKI, S ^{[1
]}

ISHIDA, Y ^{[1
]}

机构：

[1] JEOL LTD,TOKYO 196,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1985年 / 34卷 / 03期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：215 / 215

页数：1

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