On the effect of the measurement error on Shewhart t and EWMA t control charts

被引:0
|
作者
Huu Du Nguyen
Kim Phuc Tran
Giovanni Celano
Petros E. Maravelakis
Philippe Castagliola
机构
[1] Dong A University,Institute of Artificial Intelligence and Data Science
[2] GEMTEX Laboratory,Ecole Nationale Supérieure des Arts et Industries Textiles
[3] Università di Catania,Department of Civil Engineering and Architecture
[4] University of Piraeus,Department of Business Administration
[5] Université de Nantes,LS2N UMR CNRS 6004
来源
The International Journal of Advanced Manufacturing Technology | 2020年 / 107卷
关键词
Measurement errors; Char; EWMA chart; Markov chain; Statistical process control;
D O I
暂无
中图分类号
学科分类号
摘要
In the industrial practice, control charts are frequently implemented assuming that the quality characteristic of interest can be accurately measured without errors. In general, this assumption is not realistic: measurement error always exists in quality control applications and may considerably affect the performance of control charts in detecting the occurrence of an out-of-control condition. In this paper, the effect of measurement error on the statistical performance of Shewhart t and EWMA t control charts is investigated. Several tables are provided to show how the statistical performance of these control charts changes with different sources of the measurement error. The obtained results show that the measurement errors have a significant influence on the performance of both the Shewhart t and EWMA t control charts. Two examples in the analytical chemistry and food industry are presented to illustrate the use of the proposed charts.
引用
收藏
页码:4317 / 4332
页数:15
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