Premelting behavior and interfacial reaction of the Sn/Cu and Sn/Ag soldering systems during the reflow process

被引:0
|
作者
M. B. Zhou
X. Ma
X. P. Zhang
机构
[1] South China University of Technology,School of Materials Science and Engineering
[2] Harbin Institute of Technology,State Key Laboratory of Advanced Welding and Joining
关键词
Differential Scanning Calorimeter; Soldering System; Isothermal Treatment; Under Bump Metallization; Reflow Soldering Process;
D O I
暂无
中图分类号
学科分类号
摘要
The early interfacial reaction and premelting characteristics of the Sn/Cu and Sn/Ag soldering systems, and the formation and morphology transition of interfacial intermetallic compounds in the two systems during the reflow soldering process were investigated by using a differential scanning calorimeter. Results show that the initial interfacial eutectic reaction arising from atomic interdiffusion in solid-state Sn/Cu and Sn/Ag systems results in the premelting at each interface of the two systems at a temperature 4.9 and 10.6 °C respectively lower than the actual melting point of pure tin, and consequently both of the Sn/Cu and Sn/Ag soldering systems exhibit morphology change of the intermetallic compound (IMC) as the solder experiences a transition from solid-state to liquid-state in a very small temperature range. The change in the interfacial energy between the solid (or liquid) Sn-rich phase and IMC phase is the essential factor leading to the morphology transition of the interfacial IMC in the Sn/Cu and Sn/Ag soldering systems.
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页码:1543 / 1551
页数:8
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