X-Ray absorption spectroscopy: sensitive characterization of (model-) catalysts with the electron yield technique

被引:0
|
作者
T. Schedel-Niedrig
机构
[1] Fritz-Haber-Institut der Max-Planck-Gesellschaft,
[2] Faradayweg 4–6,undefined
[3] D-14195 Berlin,undefined
[4] Germany,undefined
来源
Fresenius' Journal of Analytical Chemistry | 1998年 / 361卷
关键词
Titanium; Oxide Film; Oxide Particle; White Line; Yield Mode;
D O I
暂无
中图分类号
学科分类号
摘要
Small chromium oxide particles (Cr2O3, CrO2) supported on titanium dioxide and oxidized Ag(111) single crystals were investigated by X-ray absorption spectroscopy at the oxygen K-edge. The spectra were collected in the electron yield mode in order to increase the surface sensitivity. The shape of the sharp split White line (WL) in the O K-edges spectra depended strongly on the oxidation state of the chromium ions in the probed samples suggesting that the WL can be used as an indicator of different environments in the supported chromium oxide films. On the other hand, the O K-edges of the oxidized Ag(111) crystal indicated that the formation of the distinct oxygen species at the surface and in the near-surface region was accompanied by a different silver-to-oxygen covalent interaction.
引用
收藏
页码:680 / 682
页数:2
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