Effects of Humidity and Domain Polarity on Retention Loss in Ferroelectric P(VDF-TrFE) Thin Films

被引：0
|
作者：
Seonhyoung Kim
Yukwang Kim
Kwang-Won Park
Jongin Hong
Byung-Hyuk Jun
机构：
[1] Chung-Ang University,Department of Chemistry
[2] Korea Atomic Energy Research Institute,Advanced Materials Research Division
来源：
Journal of the Korean Physical Society | 2020年 / 77卷
关键词：
P(VDF-TrFE); Ferroelectric; Thin film; Retention; Piezoresponse force microscopy;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
We investigate over a period of a 500 hours the effect of relative humidity (RH) on the retention loss in ferroelectric P(VDF-TrFE) thin films by using piezoresponse force microscopy (PFM). When the copolymer films are exposed to more water molecules, more domain reversal is observed, especially in upward domains. Interestingly, the retention loss behavior based on a stretched exponential model can be distinctly classified depending on the RH conditions. We conjecture that the absorption and the desorption of water molecules in the P(VDF-TrFE) polymers have a great influence on the reversal of ferroelectric domains.
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页码：78 / 81
页数：3
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