Effects of Humidity and Domain Polarity on Retention Loss in Ferroelectric P(VDF-TrFE) Thin Films

被引:0
|
作者
Seonhyoung Kim
Yukwang Kim
Kwang-Won Park
Jongin Hong
Byung-Hyuk Jun
机构
[1] Chung-Ang University,Department of Chemistry
[2] Korea Atomic Energy Research Institute,Advanced Materials Research Division
来源
关键词
P(VDF-TrFE); Ferroelectric; Thin film; Retention; Piezoresponse force microscopy;
D O I
暂无
中图分类号
学科分类号
摘要
We investigate over a period of a 500 hours the effect of relative humidity (RH) on the retention loss in ferroelectric P(VDF-TrFE) thin films by using piezoresponse force microscopy (PFM). When the copolymer films are exposed to more water molecules, more domain reversal is observed, especially in upward domains. Interestingly, the retention loss behavior based on a stretched exponential model can be distinctly classified depending on the RH conditions. We conjecture that the absorption and the desorption of water molecules in the P(VDF-TrFE) polymers have a great influence on the reversal of ferroelectric domains.
引用
收藏
页码:78 / 81
页数:3
相关论文
共 50 条
  • [1] Effects of Humidity and Domain Polarity on Retention Loss in Ferroelectric P(VDF-TrFE) Thin Films
    Kim, Seonhyoung
    Kim, Yukwang
    Park, Kwang-Won
    Hong, Jongin
    Jun, Byung-Hyuk
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2020, 77 (01) : 78 - 81
  • [2] Switching dynamics in ferroelectric P(VDF-TrFE) thin films
    Zhao, Dong
    Katsouras, Ilias
    Asadi, Kamal
    Blom, Paul W. M.
    de Leeuw, Dago M.
    PHYSICAL REVIEW B, 2015, 92 (21)
  • [3] Polarization Mechanisms in P(VDF-TrFE) Ferroelectric Thin Films
    Choi, Andrew C.
    Pramanick, Abhijit
    Misture, Scott T.
    Paterson, Aliso R.
    Jones, Jacob L.
    Borkiewicz, Olaf C.
    Ren, Yang
    PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2018, 12 (10):
  • [4] Effects of neutron irradiation on ferroelectric properties of P(VDF-TrFE) thin films
    Eunhye Shin
    Seonhyoung Kim
    Jongin Hong
    Byung-Hyuk Jun
    Journal of the Korean Physical Society, 2021, 79 : 197 - 204
  • [5] Effects of neutron irradiation on ferroelectric properties of P(VDF-TrFE) thin films
    Shin, Eunhye
    Kim, Seonhyoung
    Hong, Jongin
    Jun, Byung-Hyuk
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2021, 79 (02) : 197 - 204
  • [6] Nonvolatile Ferroelectric Memory Transistors Using PVDF, P(VDF-TrFE) and Blended PVDF/P(VDF-TrFE) Thin Films
    Han, Dae-Hee
    Park, Byung-Eun
    FERROELECTRIC-GATE FIELD EFFECT TRANSISTOR MEMORIES: DEVICE PHYSICS AND APPLICATIONS, 2ND EDITION, 2020, 131 : 177 - 194
  • [7] Solvent Vapor Annealing of Ferroelectric P(VDF-TrFE) Thin Films
    Hu, Jinghang
    Zhang, Jianchi
    Fu, Zongyuan
    Jiang, Yulong
    Ding, Shijin
    Zhu, Guodong
    ACS APPLIED MATERIALS & INTERFACES, 2014, 6 (20) : 18312 - 18318
  • [8] Effects of Humidity on the Microstructure and the Ferroelectric Properties of Sol-Gel grown P(VDF-TrFE) Films
    Young Joon Ko
    Da Woon Jin
    Dae Sol Kong
    Jong Hoon Jung
    Journal of the Korean Physical Society, 2020, 76 : 348 - 351
  • [9] Effects of Humidity on the Microstructure and the Ferroelectric Properties of Sol-Gel grown P(VDF-TrFE) Films
    Ko, Young Joon
    Jin, Da Woon
    Kong, Dae Sol
    Jung, Jong Hoon
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2020, 76 (04) : 348 - 351
  • [10] Effect of dielectric layer on ferroelectric responses of P(VDF-TrFE) thin films
    Mai, Manfang
    Zhu, Chuanyun
    Liu, Guohua
    Ma, Xinzhou
    PHYSICS LETTERS A, 2018, 382 (34) : 2372 - 2375