Use of Special Devices for the X-Ray Interferometric Investigation of Structural Imperfections in Single Crystals

被引：0

作者：

H. R. Drmeyan

M. S. Vasilyan

机构：

[1] Institute of Applied Problems of Physics,

[2] National Academy of Sciences of the Republic of Armenia,undefined

[3] Nalbandyan State University of Shirak,undefined

来源：

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques | 2023年 / 17卷

关键词：

multiple interferometers; moiré topogram; crystal-block bending; structural defects; scratch; dislocation generation; stress field;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：1028 / 1033

页数：5

共 50 条

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