On-chip purification via liquid immersion of arc-discharge synthesized multiwalled carbon nanotubes

被引:0
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作者
Matti J. Hokkanen
Saara Lautala
Dongkai Shao
Tuomas Turpeinen
Juha Koivistoinen
Markus Ahlskog
机构
[1] University of Jyvaskyla,Department of Physics and Nanoscience Center
[2] University of Jyvaskyla,Department of Physics
[3] University of Jyvaskyla,Department of Chemistry and Nanoscience Center
来源
Applied Physics A | 2016年 / 122卷
关键词
Contact Line; Amorphous Carbon; Surface Tension Force; Debris Particle; Detachment Force;
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学科分类号
摘要
Arc-discharge synthesized multiwalled carbon nanotubes (AD-MWNT) have been proven to be of high quality, but their use is very limited due to difficulties in obtaining them in a clean and undamaged form. Here, we present a simple method that purifies raw AD-MWNT material in laboratory scale without damage, and that in principle can be scaled up. The method consists of depositing raw AD-MWNT material on a flat substrate and immersing the substrate slowly in water, whereby the surface tension force of the liquid–substrate contact line selectively sweeps away the larger amorphous carbon debris and leaves relatively clean MWNTs on the substrate. We demonstrate the utility of the method by preparing clean individual MWNTs for measurement of their Raman spectra. The spectra exhibit the characteristics of high-quality tubes free from contaminants. We also show how one concomitantly with the purification process can obtain large numbers of clean suspended MWNTs.
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