Estimation of the characteristic parameters of the multilayered film model using the patterson differential function

被引：0
|
作者：
S. B. Astaf’ev
B. M. Shchedrin
L. G. Yanusova
机构：
[1] Russian Academy of Sciences,Shubnikov Institute of Crystallography
[2] Moscow State University,undefined
来源：
Crystallography Reports | 2010年 / 55卷
关键词：
Crystallography Report; Elementary Cell; Multilayered Film; Layer Film; Electron Density Profile;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The possibility of estimating the layered film structural parameters by constructing the autocorrelation function PF(z) (referred to as the Patterson differential function) for the derivative dρ/dz of electron density along the normal to the sample surface has been considered. An analytical expression PF(z) is presented for a multilayered film within the box model of the electron density profile. The possibilities of selecting structural information about layered films by analyzing the features of this function are demonstrated by model and real examples, in particular, by applying the method of shifted systems of peaks for the function PF(z).
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页码：127 / 135
页数：8
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