Thermal Effects on Pull-Off Force in the Johnson–Kendall–Roberts Model

被引:0
|
作者
Yunong Zhou
机构
[1] Saarland University,Department of Materials Science and Engineering
来源
Tribology Letters | 2021年 / 69卷
关键词
Pull-off force; Contact mechanics; JKR model; Thermal effects;
D O I
暂无
中图分类号
学科分类号
摘要
In this study, we investigate the effects of thermal fluctuations on the generalized Johnson–Kendall–Roberts (JKR) model. We show that the distribution of pull-off forces in this model is similar to that of the Bradley model, and is also consistent with the experiment result observed in Wierez-Kien et al. (Nanotechnology 29(15):155704 2018). Increasing temperature leads to a broadening of the distribution, while leads to a reduction of the pull-off force. Additionally, the pull-off force, which is separated into an athermal term and a thermal-induced reduction term, is measured by using spring velocity ranging over 5 orders of magnitude. We show that for compliant spring, the pull-off force is significantly enhanced with increasing velocity, which is mainly attributed to the contribution of the thermal-induced reduction term, while the athermal term is barely sensitive to changes in velocity.
引用
收藏
相关论文
共 50 条
  • [31] GUIDING STRATEGIES FOR THE ASSEMBLY OF MICRO-COMPONENTS SUBJECTED TO PLANAR PULL-OFF FORCE
    Rabenorosoa, Kanty
    Clevy, Cedric
    Rakotondrabe, Micky
    Lutz, Philippe
    PROCEEDINGS OF THE ASME INTERNATIONAL DESIGN ENGINEERING TECHNICAL CONFERENCES AND COMPUTERS AND INFORMATION IN ENGINEERING CONFERENCE, DETC 2010, VOL 4, 2010, : 873 - 879
  • [32] Effect of micro-dimple patterns on capillary pull-off force and friction force of silicon surface
    张向军
    董云开
    刘永合
    J.A.Schaefer
    Chinese Physics B, 2009, (01) : 231 - 237
  • [33] Effect of micro-dimple patterns on capillary pull-off force and friction force of silicon surface
    State Key Laboratory of Tribology, Tsinghua University, Beijing 100084, China
    不详
    Chin. Phys., 2009, 1 (231-237):
  • [34] Identification of 6H-SiC polar faces with pull-off force of atomic force microscopy
    Gan, Di
    Song, Youting
    Yang, Junwei
    Chen, Hongxiang
    Guo, Liwei
    Chen, Xiaolong
    APPLIED SURFACE SCIENCE, 2016, 390 : 917 - 923
  • [35] Modeling the pull-off force of a mushroom-shaped fibrillar adhesive in dynamic detachment
    Ji, Ru-Guo
    Yuan, Yue-Yu
    Liu, Xiao-Feng
    Zhang, Xiao-Long
    Cai, Guo-Ping
    INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES, 2025, 308
  • [36] Effect of micro-dimple patterns on capillary pull-off force and friction force of silicon surface
    Zhang Xiang-Jun
    Dong Yun-Kai
    Liu Bong-He
    Schaefer, J. A.
    CHINESE PHYSICS B, 2009, 18 (01) : 231 - 237
  • [37] Adhesion and pull-off force of an elastic indenter from an elastic half-space
    Adams, George G.
    PROCEEDINGS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 2014, 470 (2169):
  • [38] Measurement of pull-off forces by atomic force microscope in liquids used for biological applications
    Kwon, E.-Y.
    Kim, Y.-T.
    Park, J.-H.
    Kim, D.-E.
    Jung, H.-I.
    EXPERIMENTAL TECHNIQUES, 2007, 31 (04) : 40 - 45
  • [39] Measurement of pull-off forces by atomic force microscope in liquids used for biological applications
    E. -Y. Kwon
    Y. -T. Kim
    J. -H. Park
    D. -E. Kim
    H. -I. Jung
    Experimental Techniques, 2007, 31 (4) : 46 - 51
  • [40] Determination of pull-off forces of textured silicon surfaces by AFM force curve analysis
    Bachmann, Daniel
    Hierold, Christofer
    JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2007, 17 (07) : 1326 - 1333