Impact of irradiation doses on the structural, morphological, and linear–nonlinear optical properties of Ge10Sb25Se65 thin films for optoelectronic applications

被引：0
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作者：
D. Sahoo
D. Alagarasan
R. Ganesan
S. Varadharajaperumal
R. Naik
机构：
[1] ICT-IOC,Department of Engineering and Materials Physics
[2] Indian Institute of Science,Department of Physics
[3] Indian Institute of Science,Centre for Nano Science and Engineering
来源：
The European Physical Journal Plus | / 137卷
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