Characterization and comparison of X-ray focusing optics for ultrafast X-ray diffraction experiments

被引：0
|
作者：
U. Shymanovich
M. Nicoul
K. Sokolowski-Tinten
A. Tarasevitch
C. Michaelsen
D. von der Linde
机构：
[1] Universität Duisburg–Essen,Institut für Experimentelle Physik
[2] Incoatec GmbH,undefined
来源：
Applied Physics B | 2008年 / 92卷
关键词：
61.10.Nz; 41.50.+h; 87.59.-e;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
We have characterized and compared the performance of different types of multi-layer optics for the focusing of femtosecond X-ray pulses. Using X-ray pulses at 8 keV, from a laser-driven plasma source we have measured the spatial distribution of the diffracted X-rays directly after and in the focal plane of the various X-ray optical devices. For a Montel optic with 7.3× magnification we obtained the largest number of focused X-ray photons per unit angle. The performance of this optic in the X-ray diffraction experiment on a thin germanium film is demonstrated.
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页码：493 / 499
页数：6
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